DF-4462
Duplicate sensordev xname "dieN" installs two ksensordevs on one shared hw.sensors.dieN node; the CCD device's first sensor sysctl is silently dropped
Summary
On family 17h/19h both the i=0 slot and the i==sc_ncores CCD slot get xname 'dieN' with the same unit; kern_sysctl reuses the same-name node so both sensordevs share it and the second device's first sensor hits 'can't re-use a leaf' - on Zen hw.sensors.dieN.temp0 is the wrong Tctl and CCD1's node is missing. Refcount lifecycle traced clean across both clist frees. Purely a monitoring/observability defect. Distinct-xname fix.
Discussion (0)
PoC verification
Evidence pack
findings/poc/DF-4462 · 1 files| File | Type | Description | Size | |
|---|---|---|---|---|
| verdict.json | file | 890 B | view raw |
Fix verification
not_testablebaseline no→ patch + rebuild →patched clean
not_testable: hardware-gated / Info
fix in finding markdown
per-fix-DF-4462
Confirmed kernel references
Detail
Exploit chain
[]
Evidence (decisive lines)
Two sensordevs share one hw.sensors.dieN node (oid reuse); second device's first sensor sysctl silently dropped. Refcount lifecycle traced clean - no double-free. Distinct-xname fix.
Verdict
not_run: observability defect, hardware-gated
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